Logo image
Sign in
A model noise temperature for nonlinear transport in semiconductors
Journal article   Peer reviewed

A model noise temperature for nonlinear transport in semiconductors

L. Varani, P. Houlet, J.-C. Vaissière, J.-P. Nougier, E. Starikov, V. Gruzhinskis, P. Shiktorov, L. Reggiani and L. Hlou
Journal of Applied Physics, Vol.80(9), pp.5067-5075
11/1996
url
Find in HALView

Metrics

1 Record Views

Details

Logo image