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A high-reliability and low-power computing-in-memory implementation within STT-MRAM
Journal article   Open access   Peer reviewed

A high-reliability and low-power computing-in-memory implementation within STT-MRAM

Liuyang Zhang, Erya Deng, Hao Cai, You Wang, Lionel Torres, Aida Todri-Sanial and Youguang Zhang
Microelectronics Journal, Vol.81, pp.69-75
11/2018

Abstract

Computing-in-memory (CIM) Nonvolatile memory (NVM) STT-MRAM Memory wall
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