- Title
- A compact model for flicker noise in MOSFETs considering both correlated mobility and carrier number fluctuations
- Creators - without role
- Alfredo Arnaud - Universidad Católica del UruguayAlain Hoffmann - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
- Publication Details
- Analog Integrated Circuits and Signal Processing, Vol.89(3), pp.611-618
- Identifiers
- 9945273509311
- Academic Unit
- Institut d'Electronique et des Systèmes - IES
- Language
- English
- Resource Type
- Journal article
- Local Fields
- hal-02081234
Journal article
A compact model for flicker noise in MOSFETs considering both correlated mobility and carrier number fluctuations
Analog Integrated Circuits and Signal Processing, Vol.89(3), pp.611-618
12/2016
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