A Microscopic Analysis of the Carrier–Velocity Distribution and the Noise in FET Devices

Journal article

Peer reviewed

P. Houlet, H. Ueno, C. Hamaguchi, J.-C. Vaissière, J.-P. Nougier and L. Varani

physica status solidi (b), Vol.204(1), pp.470-472

11/1997

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Title: A Microscopic Analysis of the Carrier–Velocity Distribution and the Noise in FET Devices
Creators - without role: P. Houlet - Osaka University
H. Ueno - Osaka University
C. Hamaguchi - Osaka University
J.-C. Vaissière - Université de Montpellier
J.-P. Nougier - Université de Montpellier
L. Varani - Université de Montpellier
Publication Details: physica status solidi (b), Vol.204(1), pp.470-472
Identifiers: 9943273509311
Academic Unit: Université de Montpellier
Language: English
Resource Type: Journal article
Local Fields: hal-02392333