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A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits
Journal article   Peer reviewed

A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively Harden Logic Circuits

Arnaud Virazel, Imran Wali, Bastien Deveautour, Alberto Bosio, Patrick Girard and Matteo Sonza Reorda
Journal of Electronic Testing: : Theory and Applications, Vol.33(1), pp.25-36
02/2017

Abstract

Susceptibility analysis Fault injection Fault tolerance
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