- Title
- A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and Crosstalk
- Creators - without role
- Patrick Girard - Université de MontpellierMohammad Tehranipoor - University of ConnecticutJunxia Ma - University of Connecticut
- Contributors - without role
- Springer
- Publication Details
- Journal of Electronic Testing: : Theory and Applications, Vol.28(2), pp.201-214
- Identifiers
- 9942779409311
- Academic Unit
- Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
- Language
- English
- Resource Type
- Journal article
- Local Fields
- lirmm-00816589
Journal article
A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and Crosstalk
Journal of Electronic Testing: : Theory and Applications, Vol.28(2), pp.201-214
04/2012
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