- Title
- 1/f noise measurements in n-channel MOSFET's processed in 0,25 µm technology- Extraction of BSIM3v3 noise parameters
- Creators - without role
- A. Akue AllogoM. Demurcia - Centre d'Electronique et de Micro-optoélectronique de MontpellierJ.C. Vildeuil - Université de MontpellierM. Valenza - Université de MontpellierP. Llinares - STMicroelectronicsD. Cottin - STMicroelectronics
- Publication Details
- Solid-State Electronics, Vol.46, pp.361-366
- Identifiers
- 9942818809311
- Academic Unit
- Université de Montpellier
- Language
- English
- Resource Type
- Journal article
- Local Fields
- hal-00324043
Journal article
1/f noise measurements in n-channel MOSFET's processed in 0,25 µm technology- Extraction of BSIM3v3 noise parameters
Solid-State Electronics, Vol.46, pp.361-366
2002
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