Abstract
In the last decades, side-channel attacks (SCA) have demonstrated their dangerousnessin retrieving sensitive data from ICs. Among these attacks, those exploiting EM radiationsof ICs are particularly efficient. Indeed, adversaries need to find only one hotspot (positionof the EM probe over the IC surface) where there is an exploitable leakage to compromisethe security of the circuit. As a result, designing secure ICs robust against these attacks isincredibly difficult because designers must warrant there is no hotspot over the whole ICsurface. This task is all the more difficult as there is no CAD tool allowing to verify therobustness of ICs against EM SCA at the design stage, i.e. prior to fabrication. In this thesisa simulation flow allowing to reproduce EM SCA by simulation is proposed. The Biot-Savartlaw is used to model the magnetic field radiated by entire ICs and an innovative methodology, called Noise-to-Add, is introduced. This latter allows to overcome the absence of noise in simulations and correctly interpret simulation correlation attacks results.