Abstract
Test infrastructures are crucial to the modern Integrated Circuits (ICs) industry. The necessity of detecting manufacturing defects and preventing system failures in the field, makes their presence inevitable in every IC and its sub-modules. Unfortunately, test infrastructures also represent a security threat due to the augmented controllability and observability on the IC internals that they typically provide. In this thesis, we present a comprehensive analysis of the existing threats and the respective countermeasures, also providing a classification and a taxonomy of the state-of-the-art. Furthermore, we propose new security solutions, based on lightweight cryptography, for the design of test infrastructures. All proposed countermeasures belong to the category of scan encryption solutions and their purpose is to guarantee data confidentiality and user authentication. Each proposed solution is evaluated in terms of implementation costs and security capabilities. The works that have been carried out and are presented in this thesis, indicate that scan encryption is a promising solution for granting a secure design of test infrastructures.