Abstract
Near-field microwave microscopy is developped in two frequency bands. The first experiment involves very high frequencies at 60 GHz. Near-field electric probes were designed, made and tested. We have shown a sensitivity to topography and to the local dielectric constant with a very sub-wavelength resolution of lambda/250.The second experiment was conducted in the 1 MHz - 1 GHz band. Specific magnetic ferrite probes were designed and optimized with aim of integrated circuit coupling applications. We have explained the coupling by a mutual inductance which allowed to derive an electrical circuit model. Experimental applications on dedicated circuits validate the approach.