Abstract
With the evolution of the complexity and performances of digital circuits, the occurrence of failures which can not be modeled by simple stuck-at faults becomes important and even preponderant. These effects are generally not taken into account by classical diagnosis methods. The purpose of this thesis is to develop a diagnosis method targeting an enlarged set of fault models.<br /> In this manuscript, the developed diagnosis method is presented in a progressive way. First, the considered fault models are analyzed in order to show the sensitization conditions. The second part is dedicated to the whole presentation of the proposed diagnosis method. This method mainly uses an "effect-cause" approach based on critical path tracing. The third part presents the improvements of this method to take into account failures which have specific effects. The last part is dedicated to the validation of the diagnosis method throughout many experimentations on benchmark circuits.