Abstract
This thesis presents an in-depth study of conduction properties and low-frequency noise in macro- and nanoscale structures based on carbon nanotubes (CNTs). By combining analytical modeling and experimental characterization, it highlights the influence of metal contacts, environmental conditions (humidity, vacuum, degassing), and Schottky barriers on electronic transport. The analysis covers structures ranging from macroscopic films to carbon nanotube field-effect transistors (CNTFETs), incorporating 1/f and RTS noise measurements. The results emphasize the critical role of metal–nanotube interfaces and trap states in device performance, offering perspectives for optimizing CNT-based nanoelectronic components.