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Optical sectioning for reflection interference microscopy
Dataset   Open access   Peer reviewed

Optical sectioning for reflection interference microscopy

Cathie Ventalon, Oksana Kirichuk, Yotam Navon, Yan Chastagnier, Laurent Heux, Ralf Richter, Lionel Bureau and Delphine Débarre
Langmuir
10/06/2024

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