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Use of the radiation induced charge neutralization mechanism to achieve annealing of complex electronics devices
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Use of the radiation induced charge neutralization mechanism to achieve annealing of complex electronics devices

O. Quittard, Frédéric Saigné, F. Joffre, C. Oudea, L. Dusseau, J. Fesquet et J. Gasiot
36th IEEE Nuclear Space and Radiation Effects Conference (Norfolk, United States, 1999)

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