Use of nuclear codes for neutron-induced nuclear reactions in microelectronics

F. Wrobel; IEEE Computer Society

doi:10.1109/IOLTS.2005.69

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Use of nuclear codes for neutron-induced nuclear reactions in microelectronics

F. Wrobel et IEEE Computer Society

11th IEEE International On-Line Testing Symposium, Vol.2005, pp.82-86

2005

DOI: https://doi.org/10.1109/IOLTS.2005.69

Résumé

Atmosphere

Charge carrier processes

Microelectronics

Monte Carlo methods

Neutrons

Nuclear power generation

Production

Radiation effects

Silicon

Single event upset

Neutron induced nuclear reactions are known to be responsible for triggering various failures in microelectronics. Nuclear codes are very useful tools, which allow estimating the production of the secondary ions and finally the way that the component is ionized. In this work we propose to give an overview of the kind of available nuclear codes. We distinguish determinist codes from Monte Carlo ones and explained why these latter are the best adapted for the study of neutron induced failures in microcircuits.

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Détails

Titre: Use of nuclear codes for neutron-induced nuclear reactions in microelectronics
Créateurs - sans rôle: F. Wrobel - Univ. de Nice-Sophia Antipolis, France
IEEE Computer Society
Détails de publication: 11th IEEE International On-Line Testing Symposium, Vol.2005, pp.82-86
Éditeur: IEEE
Nombre de pages: 5
Identifiants: 99139287609311
Unité académique: Institut d'Electronique et des Systèmes - IES
Langue: English
Type de ressource: Conference proceeding