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Towards digital circuit approximation by exploiting fault simulation
Acte de colloque

Towards digital circuit approximation by exploiting fault simulation

Marcello Traiola, Arnaud Virazel, Patrick Girard, Mario Barbareschi et Alberto Bosio
15th IEEE East-West Design & Test Symposium
EWDTS: East-West Design & Test Symposium (Novi Sad, Serbia, 29/09/2017–02/10/2017)
2017

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