Timing-aware ATPG for critical paths with multiple TSVs

Carolina Momo Metzler; Aida Todri-Sanial; Alberto Bosio; Luigi Dilillo; Patrick Girard; Arnaud Virazel

doi:10.1109/DDECS.2014.6868774

Retour

Acte de colloque

Timing-aware ATPG for critical paths with multiple TSVs

Carolina Momo Metzler, Aida Todri-Sanial, Alberto Bosio, Luigi Dilillo, Patrick Girard et Arnaud Virazel

17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, pp.116-121

DDECS: Design and Diagnostics of Electronic Circuits and Systems (Warsaw, Poland, 23/04/2014–25/04/2014)

2014

DOI: https://doi.org/10.1109/DDECS.2014.6868774

Résumé

Defective TSVs

Commercial ATPG tools

Multiple TSVs

Path delay variations

Small delay faults

Small delay variations

Statistical delay quality level

Test patterns

Through-silicon-vias

Timing-aware ATPG

Automatic test pattern generation

Circuit faults

SDF detectability

IR-drop

3D-IC reliability

SDQL metric

TSV testing quality

Integrated circuit reliability

Electrical conditions

Integrated circuit testing

Three-dimensional integrated circuits

Small-delay faults

Delays

Three-dimensional displays

3D integration technology

3D integration

Through-Silicon vias

Resistive open defects

Critical paths

Through-Silicon-Vias (TSVs) are the key enablers of 3D integration technology. Therefore, the reliability of 3D-ICs rely on the quality of TSV testing. TSVs are prone to defects that may introduce small delay variations that can cause quality and reliability issues. Moreover, physical and electrical conditions, such as TSV dimensions, coupling and IR-drop, may affect path delay variations and consequently affect the detectability of small delay faults (SDF) induced by defective TSVs. In this work, we study the test quality and pattern effectiveness for SDF induced by TSVs. We quantity test quality using statistical delay quality level (SDQL) metric and test patterns are generated with commercial ATPG tools.

Fichiers et liens (1)

url

Find in HALAfficher

Indicateurs

1 Consultations de la notice

Détails

Titre: Timing-aware ATPG for critical paths with multiple TSVs
Créateurs - sans rôle: Carolina Momo Metzler - Test and dEpendability of microelectronic integrated SysTems
Aida Todri-Sanial - Centre National de la Recherche Scientifique
Alberto Bosio - Université de Montpellier
Luigi Dilillo - Université de Montpellier
Patrick Girard - Université de Montpellier
Arnaud Virazel - Université de Montpellier
Détails de publication: 17th International Symposium on Design and Diagnostics of Electronic Circuits & Systems, pp.116-121
Colloque: DDECS: Design and Diagnostics of Electronic Circuits and Systems (Warsaw, Poland, 23/04/2014–25/04/2014)
Identifiants: 9942636709311
Unité académique: Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Langue: English
Type de ressource: Conference proceeding
Champs locaux: lirmm-01248600