- Titre
- The Use of Ensemble Learning in Indirect Testing of Analog and RF Integrated Circuits
- Créateurs - sans rôle
- Hassan El Badawi - Test and dEpendability of microelectronic integrated SysTemsFlorence Azaïs - Test and dEpendability of microelectronic integrated SysTemsSerge Bernard - Smart Integrated Electronic SystemsMariane Comte - Test and dEpendability of microelectronic integrated SysTemsVincent Kerzérho - Smart Integrated Electronic SystemsFrançois Lefèvre - NXP (Germany)
- Colloque
- SETS 2019 - South European Test Seminar (Pitztal, Austria, 2019)
- Identifiants
- 9991410909311
- Unité académique
- Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
- Langue
- English
- Type de ressource
- Conference proceeding
- Champs locaux
- lirmm-02375866
Acte de colloque
The Use of Ensemble Learning in Indirect Testing of Analog and RF Integrated Circuits
SETS 2019 - South European Test Seminar (Pitztal, Austria, 2019)
Indicateurs
1 Consultations de la notice