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Testing Reasonant Micro-Electro-Mechanical Sensors Using the Oscillation-Based Test Methodology
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Testing Reasonant Micro-Electro-Mechanical Sensors Using the Oscillation-Based Test Methodology

Vincent Beroulle, Yves Bertrand, Laurent Latorre et Pascal Nouet
LATW 2002 - 3rd IEEE Latin American Test Workshop, pp.99-104
LATW 2002 - 3rd IEEE Latin American Test Workshop (Montevideo, Uruguay, 10/02/2002–13/02/2002)
2002

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