Test and reliability in approximate computing

Lorena Anghel; Mounir Benabdenbi; Alberto Bosio; Elena Ioana Vatajelu

doi:10.1109/IMS3TW.2017.7995210

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Acte de colloque

Test and reliability in approximate computing

Lorena Anghel, Mounir Benabdenbi, Alberto Bosio et Elena Ioana Vatajelu

22nd International Mixed-Signal Testing Workshop

IMSTW: International Mixed-Signal Testing Workshop (Thessaloniki, Greece, 03/07/2017–05/07/2017)

2017

DOI: https://doi.org/10.1109/IMS3TW.2017.7995210

Résumé

Approximate computing

Reliability

Clocks

Hardware

Power demand

Energy efficiency

Software

PACS 85.42

This paper presents an overview of approximate computing, from the perspective of a test/reliability engineer. The focus of this paper is not on the actual conception of approximate hardware/software/algorithms, but on how specific methods for test and reliability can be used to improve the characteristics (power consumption, area, life expectancy, precision) of approximate computing.

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Détails

Titre: Test and reliability in approximate computing
Créateurs - sans rôle: Lorena Anghel - Techniques of Informatics and Microelectronics for Integrated Systems Architecture
Mounir Benabdenbi - Techniques of Informatics and Microelectronics for Integrated Systems Architecture
Alberto Bosio - Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
Elena Ioana Vatajelu - Techniques of Informatics and Microelectronics for Integrated Systems Architecture
Détails de publication: 22nd International Mixed-Signal Testing Workshop
Colloque: IMSTW: International Mixed-Signal Testing Workshop (Thessaloniki, Greece, 03/07/2017–05/07/2017)
Identifiants: 9942852609311
Unité académique: Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Langue: English
Type de ressource: Conference proceeding
Champs locaux: hal-01702768