Temperature profile estimation for high spatial resolution space charge measurement with thermal pulse methods

Celine Corbrion; Stephane Hole; Petru Notingher; Serge Agnel; Laurent Berquez; Didier Marty-Dessus; IEEE

Retour

Acte de colloque

Temperature profile estimation for high spatial resolution space charge measurement with thermal pulse methods

Celine Corbrion, Stephane Hole, Petru Notingher, Serge Agnel, Laurent Berquez, Didier Marty-Dessus et IEEE

2017 INTERNATIONAL SYMPOSIUM ON ELECTRICAL INSULATING MATERIALS (ISEIM), VOLS 1 & 2, pp.173-175

01/01/2017

Résumé

Engineering

Engineering, Electrical & Electronic

Materials Science

Materials Science, Multidisciplinary

Science & Technology

Technology

High spatial resolution can be reached for space charge distribution measurement with thermal methods provided an accurate estimation of the temperature profile throughout the material. In this paper we show how to calculate such temperature profile from the measurement of the surface temperature of the sample by bolometric effect.

Indicateurs

1 Consultations de la notice

Détails

Titre: Temperature profile estimation for high spatial resolution space charge measurement with thermal pulse methods
Créateurs - sans rôle: Celine Corbrion - Université Paris Sciences et Lettres
Stephane Hole - Sorbonne Univ ESPCI Paris, PSL Res Univ CNRS, LPEM UPMC, F-75005 Paris, France
Petru Notingher - IES Univ Montpellier 2 CNRS, F-34390 Montpellier, France
Serge Agnel - IES Univ Montpellier 2 CNRS, F-34390 Montpellier, France
Laurent Berquez - LAPLACE Univ Paul Sabatier CNRS, F-31062 Toulouse, France
Didier Marty-Dessus - LAPLACE Univ Paul Sabatier CNRS, F-31062 Toulouse, France
IEEE
Détails de publication: 2017 INTERNATIONAL SYMPOSIUM ON ELECTRICAL INSULATING MATERIALS (ISEIM), VOLS 1 & 2, pp.173-175
Éditeur: IEEE
Nombre de pages: 3
Identifiants: 99139281209311
Unité académique: Institut d'Electronique et des Systèmes - IES
Langue: English
Type de ressource: Conference proceeding