Logo image
Se connecter
Temperature and Fast Voltage On-Chip Monitoring using Low-Cost Digital Sensors
Acte de colloque   Open Access

Temperature and Fast Voltage On-Chip Monitoring using Low-Cost Digital Sensors

Lionel Vincent, Philippe Maurine, Edith Beigné, Suzanne Lesecq et Julien Mottin
4th International Workshop on CMOS Variability
VARI: Workshop on CMOS Variability (Karlsruhe, Germany, 09/09/2013–11/09/2013)
2013

Résumé

AVFS DVFS calibration digital sensors low-power architecture monitoring temperature variability voltage drop power management statistical test hypothesis test

Fichiers et liens (1)

url
Find in HALAfficher

Indicateurs

1 Consultations de la notice

Détails

Logo image