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TWIN-RELECT: Twinning for Excellence in Reliable Electronics
Acte de colloque   Open Access

TWIN-RELECT: Twinning for Excellence in Reliable Electronics

Marko Andjelkovic, Fabian Vargas, Milos Krstic, Luigi Dilillo, Alain Michez, Frederic Wrobel, Davide Bertozzi, Mikel Lujan, Christos Georgakidis, Nikolaos Chatzivangelis, …
Published in the Proceedings of the IEEE 2025 DATE Conference
Design, Automation and Test in Europe Conference (Lyon, France, 31/03/2025)

Résumé

permanent faults transient faults EDA tools Reliable integrated circuits

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