Suppressed surface leakage current using nBn infrared detector based on type IIInAs/GaSb strain layer superlattices

H. S. Kim; G. D. Bishop; J. B. Rodriguez; Y. D. Sharma; E. Plis; L. R. Dawson; S. Krishna; IEEE

doi:10.1109/LEOS.2007.4382573

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Suppressed surface leakage current using nBn infrared detector based on type IIInAs/GaSb strain layer superlattices

H. S. Kim, G. D. Bishop, J. B. Rodriguez, Y. D. Sharma, E. Plis, L. R. Dawson, S. Krishna et IEEE

2007 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2, pp.648-649

IEEE Lasers and Electro-Optics Society (LEOS) Annual Meeting

01/01/2007

DOI: https://doi.org/10.1109/LEOS.2007.4382573

Résumé

Engineering

Engineering, Electrical & Electronic

Nanoscience & Nanotechnology

Optics

Physical Sciences

Science & Technology

Science & Technology - Other Topics

Technology

We present a SLS-based nBn infrared detector which suppresses the surface leakage current without using any passivation technique. The dark current density is reduced by an order of magnitude at 77 K compared with a conventional mesa etched device.

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Détails

Titre: Suppressed surface leakage current using nBn infrared detector based on type IIInAs/GaSb strain layer superlattices
Créateurs - sans rôle: H. S. Kim - Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87106 USA
G. D. Bishop - Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87106 USA
J. B. Rodriguez - Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87106 USA
Y. D. Sharma - Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87106 USA
E. Plis - Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87106 USA
L. R. Dawson - University of New Mexico
S. Krishna - Univ New Mexico, Ctr High Technol Mat, Albuquerque, NM 87106 USA
IEEE
Détails de publication: 2007 IEEE LEOS ANNUAL MEETING CONFERENCE PROCEEDINGS, VOLS 1 AND 2, pp.648-649
Publications en série: IEEE Lasers and Electro-Optics Society (LEOS) Annual Meeting
Éditeur: IEEE
Nombre de pages: 2
Identifiants: 99139380709311
Unité académique: Institut d'Electronique et des Systèmes - IES
Langue: English
Type de ressource: Conference proceeding