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Study of low frequency noise in advanced SiGe : C heterojunction bipolar transistors
Acte de colloque

Study of low frequency noise in advanced SiGe : C heterojunction bipolar transistors

M. Seif, F. Pascal, B. Sagnes, A. Hoffmann, S. Haendler, P. Chevalier et D. Gloria
44th European Solid State Device Research Conference (ESSDERC) (Venise, Italy, 2014)

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