Résumé
The impact of different manufacturing process and designs on the TID-ATREEs synergistic effect is investigated in the LM124 operational amplifier (opamp) from three different manufacturers. Significant variations were observed on both the Total Ionizing Dose (TID) sensitivity and the Analog Transient Effects on Electronics Effects (ATREE) responses of LM124 devices from different manufacturer. The ATREEs are produced by high dose-rate X-ray pulses using a flash X-ray facility. ATREE modeling results were performed using a previously developed simulation tool. Index Terms—Bipolar analog integrated circuits, circuit modeling, ionizing dose, transient response, X-ray effects.