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Stuck-at-Faults Test using Differential Power Analysis
Acte de colloque

Stuck-at-Faults Test using Differential Power Analysis

Giorgio Di Natale, Marie-Lise Flottes et Bruno Rouzeyre
LPonTR'08: Workshop on Low Power Design Impact on Test and Reliability (Italy, 29/05/2008–29/05/2008)
29/05/2008

Résumé

Test DPA
In this paper we propose a new strategy for fault obser-vation based on the measurement of the power con-sumed by the circuit during the application of test vec-tors. Power supply measures and analysis used for the proposed technique are based on the Differential Power Analysis (DPA) method, originally proposed to tamper crypto devices.

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