Stochastic model for phase noise measurement from 1-bit signal acquisition

Stéphane David-Grignot; Florence Azaïs; François Lefevre; Laurent Latorre

doi:10.1109/IMS3TW.2014.6997400

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Stochastic model for phase noise measurement from 1-bit signal acquisition

Stéphane David-Grignot, Florence Azaïs, François Lefevre et Laurent Latorre

19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop

IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop (Porto Alegre, Brazil, 17/09/2014–19/09/2014)

2014

DOI: https://doi.org/10.1109/IMS3TW.2014.6997400

Résumé

Analog signals

One bit acquisition

Phase noise

Stochastic model

Digital signal processing

This paper presents a novel method for phase noise measurement from 1-bit acquisition of an analog signal. A stochastic model is developed that permits to establish an analytical relationship between the phase noise level present in the analog signal and the characteristics of the binary data captured with a digital ATE. The technique is validated through both simulations and hardware measurements.

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Titre: Stochastic model for phase noise measurement from 1-bit signal acquisition
Créateurs - sans rôle: Stéphane David-Grignot - Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
Florence Azaïs - Test and dEpendability of microelectronic integrated SysTems
François Lefevre - Laboratoire de Physique Corpusculaire de Caen
Laurent Latorre - Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
Détails de publication: 19th Annual International Mixed-Signals, Sensors, and Systems Test Workshop
Colloque: IMS3TW: International Mixed-Signals, Sensors, and Systems Test Workshop (Porto Alegre, Brazil, 17/09/2014–19/09/2014)
Identifiants: 9944880809311
Unité académique: Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
Langue: English
Type de ressource: Conference proceeding
Champs locaux: lirmm-01119368