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Steganalysis by Ensemble Classifiers with Boosting by Regression, and Post-Selection of Features
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Steganalysis by Ensemble Classifiers with Boosting by Regression, and Post-Selection of Features

Marc Chaumont et Sarra Kouider
19th IEEE International Conference on Image Processing, pp.1133-1136
ICIP: International Conference on Image Processing (Orlando, FL, United States, 30/09/2012–03/10/2012)
30/09/2012

Résumé

Features selection Boosting Ensemble classifiers Steganlaysis

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