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Statistical Sizing Methodology of an SRAM in Presence of Signal Races and Variability Conditions
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Statistical Sizing Methodology of an SRAM in Presence of Signal Races and Variability Conditions

Michael Yap San Min, Patrick Maurine, Michel Robert et Magali Bastian Hage-Hassan
IFIP VLSI-SOC 2008 - IFIP/IEEE WG 10.5 International Conference on Very Large Scale Integration, pp.193-198
IFIP VLSI-SOC 2008 - IFIP/IEEE WG 10.5 International Conference on Very Large Scale Integration
10/10/2008

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