Statistical Energy Study for 28nm FDSOI Devices

Rida Kheirallah; Jean-Marc J.-M. Galliere; Aida Todri-Sanial; Gilles R. Ducharme; Nadine Azemard

doi:10.1109/EuroSimE.2015.7103149

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Statistical Energy Study for 28nm FDSOI Devices

Rida Kheirallah, Jean-Marc J.-M. Galliere, Aida Todri-Sanial, Gilles R. Ducharme et Nadine Azemard

16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems

EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (Budapest, Hungary, 19/04/2015–22/04/2015)

2015

DOI: https://doi.org/10.1109/EuroSimE.2015.7103149

Résumé

Due to the effects of the Moore’s law, the process variations in current technologies are increasing and have a major impact on power and performance which results in parametric yield loss. Due to this, process variability and the difficulty of modeling accurately transistor behavior impede the dimensions scaling benefits. The Fully Depleted Silicon-On-Insulator (FDSOI) technology is one of the main contenders for deep submicron devices as they can operate at low voltage with superior energy efficiency compared with bulk CMOS. In this paper, we study the static energy on 28nm FDSOI devices to implement sub-threshold circuits. Study of delay vs. static power trade-off reveals the FDSOI robustness with respect to process variations.

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Détails

Titre: Statistical Energy Study for 28nm FDSOI Devices
Créateurs - sans rôle: Rida Kheirallah - Laboratoire d'Informatique, de Robotique et de Microélectronique de Montpellier
Jean-Marc J.-M. Galliere - Test and dEpendability of microelectronic integrated SysTems
Aida Todri-Sanial - Centre National de la Recherche Scientifique
Gilles R. Ducharme - Université de Montpellier
Nadine Azemard - Centre National de la Recherche Scientifique
Détails de publication: 16th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems
Colloque: EuroSimE: Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems (Budapest, Hungary, 19/04/2015–22/04/2015)
Identifiants: 99150704609311
Unité académique: Institut Montpelliérain Alexander Grothendieck - IMAG; Laboratoire d'Informatique de Robotique et de Microélectronique de Montpellier - LIRMM
Langue: English
Type de ressource: Conference proceeding
Champs locaux: lirmm-01168602