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Specific aspects of type II heteropolytype stacking faults in SiC
Acte de colloque

Specific aspects of type II heteropolytype stacking faults in SiC

Sandrine Juillaguet et Jean Camassel
SILICON CARBIDE AND RELATED MATERIALS 2004, Vol.483, pp.335-340
5th European Conference on Silicon Carbide and Related Materials (Bologna (ITALY), France, 31/08/2004)
2005

Résumé

4H-SiC stacking faults 3C-SiC quantum wells 4H-SIC LAYERS TRANSFORMATION INCLUSIONS POLYTYPES OXIDATION GROWTH
Focussing on the fine structure of excitons bound to large 2-dimensional stacking faults in a 4H-SiC matrix, we show that the intrinsic type-II nature of the band alignment, combined with the effect of the spontaneous polarization, should result in a double bound-exciton signature per well. Then, we present the first observation of a 3C-QW sandwiched between two higher energy bandgap, polytypes in a 3C-SiC matrix.

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