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Something I Always Wanted to Know About Test, But Was Afraid to Ask
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Something I Always Wanted to Know About Test, But Was Afraid to Ask

Christian Landrault
14th IEEE European Test Symposium
ETS: European Test Symposium (Séville, Spain, 25/05/2009–29/05/2009)
05/2009

Résumé

Test digital integrated circuits fabrication yield low power testing
As pinpointed in the last ITRS report and also clearly highlighted in the past years test conference programs, the overall mission of manufacturing test is continuously shifting from its "screening defects" basic and primary objective towards more subtle and secondary goals constituted for example by reliability aspect and yield learning. Just after his retirement, the author examines these new testing opportunity and will try to give directions to all what he missed and failed to do in his research carrier.

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