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Software controlled cell bit-density to improve NAND flash lifetime
Acte de colloque

Software controlled cell bit-density to improve NAND flash lifetime

Xavier Jimenez, David Novo, Paolo Ienne et IEEE
Proceedings of the 49th Annual Design Automation Conference, pp.229-234
ACM Conferences
DAC '12: The 49th Annual Design Automation Conference 2012
03/06/2012

Résumé

Hardware -- Integrated circuits -- Semiconductor memory

Indicateurs

1 Consultations de la notice

Détails

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