Résumé
CMOS technologies continue to evolve with the promise of improved computation, integration and power performances, while the diffusion of off-the-shelf components into high-reliability applications challenges their robustness with respect to radiation environments. This course will first present a review of the main features of state-of-the-art CMOS technologies of the ultra-deep sub-micron era, either currently in production orexpected for the years to come. Some trends concerning the simultaneous evolution of chips architecture will also be introduced. The single-event effects of radiation will then be defined and their specificities related to advanced technologies will be illustrated by a review of the recent literature. Some implications for radiation effects modelling, tolerant design, and hardness assurance will be discussed.