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Simulating Laser Effects on ICs, from Physical Level to Gate Level: a comprehensive approach
Acte de colloque   Open Access

Simulating Laser Effects on ICs, from Physical Level to Gate Level: a comprehensive approach

Feng Lu, Giorgio Di Natale, Marie-Lise Flottes et Bruno Rouzeyre
TRUDEVICE Workshop on Test and Fault Tolerance for Secure Devices
TRUDEVICE Workshop (Paderborn, Germany, 29/05/2014–30/05/2014)
29/05/2014

Résumé

Laser effect

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