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Security primitives (PUF and TRNG) with STT-MRAM
Acte de colloque

Security primitives (PUF and TRNG) with STT-MRAM

Elena Ioana Vatajelu, Giorgio Di Natale et Paolo Prinetto
34th IEEE VLSI Test Symposium
VTS: VLSI Test Symposium (Las Vegas, United States, 25/04/2016–27/04/2016)
2016

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