Résumé
As the CMOS technology is continuously scaling down, nano-scale integrated circuits are becoming susceptible to harsh-radiation induced soft errors, such as double-node upsets (DNUs) and triple-node upsets (TNUs). This paper presents a shuttle C-elements based low-cost and robust latch (namely SCLCRL) that can recover from any TNU in harsh radiation environments. The latch comprises seven primary storage nodes and seven secondary storage nodes. Each pair of primary nodes feeds a secondary node through one C-element (CE) and each pair of secondary nodes feeds a primary node through another CE, forming redundant feedback loops to robustly retain values. Simulation results validate all key TNUs' recoverability features of the proposed latch. Simulation results also demonstrate that the proposed SCLCRL latch can approximately save 29% silicon area and 47% D-Q delay on average at the cost of moderate power, compared with the state-of-the-art TNU-recoverable reference latches of the same-type.