Response of Correlated Double Sampling CMOS Imager Circuit to Random Telegraph Signal Noise

Acte de colloque

C. Leyris, J-C. Vildeuil, F. Roy, Frédéric Martinez, M. Valenza et A. Hoffmann

2006 International Caribbean Conference on Devices, Circuits and Systems, pp.109-114

2006 International Caribbean Conference on Devices, Circuits and Systems (Playa del Carmen, Mexico, 26/04/2006–26/04/2006)

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Titre: Response of Correlated Double Sampling CMOS Imager Circuit to Random Telegraph Signal Noise
Créateurs - sans rôle: C. Leyris - STMicroelectronics (France)
J-C. Vildeuil - STMicroelectronics (France)
F. Roy - STMicroelectronics (France)
Frédéric Martinez - Centre d'Electronique et de Micro-optoélectronique de Montpellier
M. Valenza - Université de Montpellier
A. Hoffmann - Université de Montpellier
Détails de publication: 2006 International Caribbean Conference on Devices, Circuits and Systems, pp.109-114
Colloque: 2006 International Caribbean Conference on Devices, Circuits and Systems (Playa del Carmen, Mexico, 26/04/2006–26/04/2006)
Identifiants: 9942618209311
Unité académique: Institut d'Electronique et des Systèmes - IES
Langue: English
Type de ressource: Conference proceeding
Champs locaux: hal-02066885