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Resonant multi-dielectric coverslip for enhanced total internal reflection fluorescence microscopy
Acte de colloque   Open Access

Resonant multi-dielectric coverslip for enhanced total internal reflection fluorescence microscopy

Yousra Toumi, Anita Mouttou, Fabien Lemarchand, Guillaume Demesy, Cihan Koc, Delphine Muriaux, Antonin Moreau, Julien Lumeau, Cyril Favard et Aude L. Lereu
ICTON - 23th International conference on transparent optical network (Bucharest (Romania), Romania, 02/07/2023–06/07/2023)

Résumé

TIRF Microscopy Thin films Field enhancement Evanescent beam

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1 Consultations de la notice

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