Georgios Tsiligiannis - Test and dEpendability of microelectronic integrated SysTems
Luigi Dilillo - Test and dEpendability of microelectronic integrated SysTems
Alberto Bosio - Test and dEpendability of microelectronic integrated SysTems
Patrick Girard - Test and dEpendability of microelectronic integrated SysTems
Serge Pravossoudovitch - Test and dEpendability of microelectronic integrated SysTems
Aida Todri-Sanial - Smart Integrated Electronic Systems
Arnaud Virazel - Test and dEpendability of microelectronic integrated SysTems
Philippe Cocquerez - Centre National d'Études Spatiales
Jean-Luc Autran - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
Antonio Litterio - Institut des Matériaux, de Microélectronique et des Nanosciences de Provence
Frédéric Wrobel - Université de Montpellier, Institut d'Electronique et des Systèmes - IES
Frédéric Saigné - Université de Montpellier, Institut d'Electronique et des Systèmes - IES