Résumé
In this paper, we showcase our new immunity test bench dedicated to electromagnetic field in millimetre band at near-field distance and high power. The main goal of this test bench is to trigger perturbations caused by several type of near-field emission in terms of power, frequency, or modulation in various electronic circuits. After an exhaustive description of the test bench, we will present the first result obtained. These prove that a component dedicated to radio frequency is influenced by millimeter-wave.