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Quantum Hall resistance standard in graphene grown by CVD on SiC: state-of-the-art of the experimental mastery
Acte de colloque

Quantum Hall resistance standard in graphene grown by CVD on SiC: state-of-the-art of the experimental mastery

J. Brun-Picard, R. Dagher, D. Mailly, A. Nachawaty, Benoit Jouault, A. Michon, W. Poirier et F. Schopfer
2018 CONFERENCE ON PRECISION ELECTROMAGNETIC MEASUREMENTS (CPEM 2018) (345 E 47TH ST, NEW YORK, NY 10017 USA, Unknown Region, 2018)
2018

Résumé

Graphene materials science and technology measurement standards metrology quantum Hall effect devices

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