Proceedings of IEEE 21st International Mixed-Signals Test Workshop (IMSTW 2016)

Serge Bernard; Manuel J. Barragan; William R. Eisenstadt; Ke Huang

doi:10.1109/IMS3TW.2016.7524214

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Conference proceeding

Proceedings of IEEE 21st International Mixed-Signals Test Workshop (IMSTW 2016)

Serge Bernard, Manuel J. Barragan, William R. Eisenstadt and Ke Huang

IMSTW: International Mixed-Signals Test Workshop (Sant Feliu de Guíxols, Spain, 04/07/2016–06/07/2016)

2016

DOI: https://doi.org/10.1109/IMS3TW.2016.7524214

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Twenty-one years ago, the IEEE Mixed-Signal Test Workshop (IMSTW) was inaugurated as one of the main forums that bring together the test community to discuss ideas and views specifically for analog, mixed-signal, and RF circuits and systems. IMSTW was renamed in 2008 to IEEE Mixed- Signal, Systems, and Sensors Test Workshop (IMS3TW) and was expanded to include new topics that address sensors and sensor-based systems, as well as emerging devices and systems. In 2015, we returned to the original name IMSTW to celebrate the 20th anniversary.

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Title: Proceedings of IEEE 21st International Mixed-Signals Test Workshop (IMSTW 2016)
Creators - without role: Serge Bernard - Conception et Test de Systèmes MICroélectroniques
Manuel J. Barragan - Techniques de l'Informatique et de la Microélectronique pour l'Architecture des systèmes intégrés
William R. Eisenstadt - University of Florida [Gainesville]
Ke Huang - San Diego State University
Conference: IMSTW: International Mixed-Signals Test Workshop (Sant Feliu de Guíxols, Spain, 04/07/2016–06/07/2016)
Identifiers: 9945164709311
Academic Unit: Laboratoire d'Informatique de Robotique et de Microélectronique de Mtp - LIRMM
Language: English
Resource Type: Conference proceeding
Local Fields: lirmm-01433610