Prediction of transients induced by neutrons/protons in CMOS combinational logic cells

A. Hubert; A. Bougerol; F. Miller; N. Buard; Lorena Anghel; T. Carriere; Frédéric Wrobel; R. Gaillard

doi:10.1109/IOLTS.2006.51

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Prediction of transients induced by neutrons/protons in CMOS combinational logic cells

A. Hubert, A. Bougerol, F. Miller, N. Buard, Lorena Anghel, T. Carriere, Frédéric Wrobel et R. Gaillard

On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International

ISBN: 0-7695-2620-9

12th IEEE International On-Line Testing Symposium (IOLTS'06) (Lake Como, Italy, 2006)

2006

DOI: https://doi.org/10.1109/IOLTS.2006.51

Résumé

Monte-Carlo-method

CMOS-realization

PACS 85.42

This paper presents a new Monte-Carlo methodology to investigate the transient effect occurrence in complementary metal oxide semiconductor (CMOS) logic circuits: TMC DASIE (transient Monte-Carlo detailed analysis of secondary ion effects). The production and effects of single-event transients inside CMOS combinational logic gates are examined. First results and perspectives are presented.

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Détails

Titre: Prediction of transients induced by neutrons/protons in CMOS combinational logic cells
Créateurs - sans rôle: A. Hubert - EADS, Corporate Research Center
A. Bougerol - EADS, Corporate Research Center
F. Miller - EADS, Corporate Research Center
N. Buard - EADS, Corporate Research Center
Lorena Anghel - Techniques of Informatics and Microelectronics for Integrated Systems Architecture
T. Carriere - EADS, Corporate Research Center
Frédéric Wrobel - LPES - Laboratoire de Physique Electronique des Solides, EA 1174
R. Gaillard - INFODUC SA
Détails de publication: On-Line Testing Symposium, 2006. IOLTS 2006. 12th IEEE International
Colloque: 12th IEEE International On-Line Testing Symposium (IOLTS'06) (Lake Como, Italy, 2006)
Publications en série: ISBN: 0-7695-2620-9
Identifiants: 9947084209311
Unité académique: Université de Montpellier
Langue: English
Type de ressource: Conference proceeding
Champs locaux: hal-00142517