Résumé
Managing power consumption of circuits and systems is one of the most important challenges for the semiconductor industry in the era of IoT. Power management techniques are used today to control the power dissipation during functional operation. Since the application of these techniques has profound implications on manufacturing test, power-aware testing has become indispensable for low-power LSIs and IoT devices. This tutorial provides a comprehensive and practical coverage of power-aware testing. Its first part gives the background and discusses power issues during test. The second part provides comprehensive information on structural and algorithmic solutions for alleviating test-power-related problems. The third part outlines low-power design techniques and shows how low-power devices can be tested safely without affecting yield and reliability.