- Titre
- Porosity of supported thin films and membranes studied by ellipsometric porosimetry
- Créateurs - sans rôle
- V. Rouessac - Université de Montpellier, Institut Européen des Membranes - IEM
- Colloque
- Workshop on Scattering and X-Ray spectroscopy Characterization Techniques for Membranes and Porous Materials (Lillehammer, Norway, 25/06/2006)
- Identifiants
- 9942318409311
- Unité académique
- Institut Européen des Membranes - IEM
- Langue
- English
- Type de ressource
- Conference proceeding
- Champs locaux
- hal-00161226
Acte de colloque
Porosity of supported thin films and membranes studied by ellipsometric porosimetry
Workshop on Scattering and X-Ray spectroscopy Characterization Techniques for Membranes and Porous Materials (Lillehammer, Norway, 25/06/2006)
Indicateurs
1 Consultations de la notice