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Performance exploration of partially connected 3D NoCs under manufacturing variability
Acte de colloque

Performance exploration of partially connected 3D NoCs under manufacturing variability

Anelise Kologeski, Fernanda Lima Kastensmidt, Vianney Lapotre, Abdoulaye Gamatié, Gilles Sassatelli et Aida Todri-Sanial
NEWCAS 2014 - 12th IEEE International New Circuits and Systems Conference, pp.61-64
NEWCAS 2014 - 12th IEEE International New Circuits and Systems Conference (Trois-Rivieres, QC, Canada, 22/06/2014–25/06/2014)
2014

Résumé

Resistive defective TSV Delay variation TSV propagation delays Open defective TSV TSVs Through-silicon vias Integrated circuit manufacture Three-dimensional integrated circuits Network routing Three-dimensional displays Fault tolerance Manufacturing variability Telecommunication traffic Serialization Asynchronous communication interfaces Delay distribution Partially connected 3D NoC Partially asynchronous 3D NoCs Yield Routing Elevators Clocks Delays Network-on-chip Serial communication 3D network-on-chip Adaptive routing 3D manufacture variability

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