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Oral : "Pore sealing of nanoporous hybrid thin films studied by ellipsometric porosimetry"
Acte de colloque

Oral : "Pore sealing of nanoporous hybrid thin films studied by ellipsometric porosimetry"

V. Rouessac, W. Puyrenier, A. van Der Lee, L. Broussous, D. Rebiscoul, J. Durand et A. Ayral
4th Workshop Ellipsometry (Berlin, Germany, 2006)
2006

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