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Oral : "Plasma enhanced CVD layers analysed by ellipsometry coupled with vapour adsorption"
Acte de colloque

Oral : "Plasma enhanced CVD layers analysed by ellipsometry coupled with vapour adsorption"

V. Rouessac, A. Ayral et J. Durand
15th International Colloquium on Plasma Processes - June 5-9, 2005 (Autrans, France, 2005)
2005

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